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Yield stress and thixotropy: on the difficulty of measuring yield stresses in practice

Corresponding authors
Laboratoire de Physique Statistique, Ecole Normale Supérieure, 24 Rue Lhomond, Paris cedex 05
Departement C.I.T., K.U. Leuven de Croylaan 46, Leuven, Belgium
Van der Waals-Zeeman Institute, University of Amsterdam, Valckenierstraat 65, Amsterdam, The Netherlands
Soft Matter, 2006,2, 274-283

DOI: 10.1039/B517840A
Received 15 Dec 2005, Accepted 27 Jan 2006
First published online 17 Feb 2006
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