Issue 24, 2014

Real space probe of short-range interaction between Cr in a ferromagnetic semiconductor ZnCrTe

Abstract

The short-range interaction between Cr atoms was directly examined by scanning tunneling microscopy measurements on a Zn0.95Cr0.05Te film. Our measurements revealed that a Cr atom formed a localized state within the bandgap of ZnTe and this state was broadened for a pair of Cr atoms within a distance of ∼1 nm.

Graphical abstract: Real space probe of short-range interaction between Cr in a ferromagnetic semiconductor ZnCrTe

Article information

Article type
Communication
Submitted
21 Aug 2014
Accepted
17 Oct 2014
First published
22 Oct 2014

Nanoscale, 2014,6, 14667-14673

Author version available

Real space probe of short-range interaction between Cr in a ferromagnetic semiconductor ZnCrTe

K. Kanazawa, T. Nishimura, S. Yoshida, H. Shigekawa and S. Kuroda, Nanoscale, 2014, 6, 14667 DOI: 10.1039/C4NR04826A

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