Issue 13, 2013
From the journal:

Nanoscale

Measurements of contact specific low-bias negative differential resistance of single metalorganic molecular junctions†

Jianfeng Zhou,a   Satyabrata Samanta,b   Cunlan Guo,a   Jason Locklinb  and  Bingqian Xu*a  

* Corresponding authors

a Single Molecule Study Laboratory, College of Engineering and Nanoscale Science and Engineering Center, University of Georgia, Athens, GA 30602, USA
E-mail: bxu@engr.uga.edu
Fax: +1-706-542-3804
Tel: +1-706-542-0502

b Complex Carbohydrate Research Center and Department of Biochemistry and Molecular Biology, University of Georgia, Athens, GA 30602, USA

Abstract

Negative differential resistance (NDR) behaviors of single molecule junctions composed of a thiol-terminated Ru(II) bis-terpyridine (Ru(tpy-SH)2) molecule sandwiched between two gold electrodes are measured using a specifically modified scanning probe microscope break junction technique (SPMBJ) at room temperature. The low-bias (0.623 ± 0.135 V) NDR observed for one of the three conductance groups is contact specific and is caused by a bias induced electrode–molecule coupling changes.

Graphical abstract: Measurements of contact specific low-bias negative differential resistance of single metalorganic molecular junctions

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Article information

DOI
https://doi.org/10.1039/C3NR01284K
Article type
Communication
Submitted
13 Mar 2013
Accepted
29 Apr 2013
First published
07 May 2013

Nanoscale, 2013,5, 5715-5719

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Measurements of contact specific low-bias negative differential resistance of single metalorganic molecular junctions

J. Zhou, S. Samanta, C. Guo, J. Locklin and B. Xu, Nanoscale, 2013, 5, 5715 DOI: 10.1039/C3NR01284K

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