Issue 9, 2011

Solution patterning of ultrafine ITO and ZnRh2O4nanowire array below 20 nm without etching process

Abstract

Transparent conductive patterns have significant applications in various optoelectronic devices. A low cost solution process to directly fabricate transparent conductive oxide nanopatterns was developed without a conventional lithographic or etching process. A uniform and high density array of ITO and ZnRh2O4 nanopatterns was fabricated with block copolymer self-assembly and spin coating technology. A low resistivity of about 3–9 × 10−4 Ω cm and high transmission of 90% in the visible spectrum region was demonstrated with uniform ITO nanopatterns with feature size of 24 nm. The first p-type ZnRh2O4 nanopattern was also fabricated with low resistivity and small feature size of 15 nm. This cost-efficient and large area scalable process can fabricate patterns with feature size down to sub-20 nm, providing a faster patterning capability compared to conventional photolithography and etching processes.

Graphical abstract: Solution patterning of ultrafine ITO and ZnRh2O4 nanowire array below 20 nm without etching process

Article information

Article type
Communication
Submitted
10 May 2011
Accepted
07 Jul 2011
First published
04 Aug 2011

Nanoscale, 2011,3, 3598-3600

Solution patterning of ultrafine ITO and ZnRh2O4 nanowire array below 20 nm without etching process

G. Xia and S. Wang, Nanoscale, 2011, 3, 3598 DOI: 10.1039/C1NR10479A

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