Ultrahigh density data storage based on organic materials with SPM techniques

Abstract

With the ever-increasing demand of expansive storage capacity and the continuous miniaturization of optoelectronic device, ultrahigh density data storage has attracted intensive research interest. In this feature article, recent progress on the developments of ultrahigh density data storage based on organic materials is summarized and discussed, it especially focuses on materials for data recording using scanning tunneling microscopy (STM), atom force microscopy (AFM), and scanning near-field microscopy (SNOM). The focus is placed on the rational design and synthesis of new organic recording media to realize and improve nanoscale data storage. In addition, an outlook in this field is also discussed.