Issue 10, 2003

Growth control and characterization of vertically aligned IrO2nanorods

Abstract

Iridium dioxide (IrO2) nanorods with pointed tips have been grown on Si(100) and transition-metal-coated-Si(100) substrates, via metal–organic chemical vapor deposition (MOCVD), using (MeCp)Ir(COD) as the source reagent. The as-deposited nanorods were characterized using field-emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). FESEM micrographs revealed that the majority of the nanorods are a wedge shape in cross section and converge at top; occasionally several of them pack into a column of a spiral tip. The vertical alignment and packing density are significantly improved by prior deposition of a thin layer of Ti on Si. TEM and XRD results indicate that the sputtered Ti thin layer erects the nanorods in the c-axis direction. XPS spectra show that iridium in IrO2 nanorods also exist in a higher oxidation state.

Graphical abstract: Growth control and characterization of vertically aligned IrO2 nanorods

Article information

Article type
Paper
Submitted
19 May 2003
Accepted
29 Jul 2003
First published
13 Aug 2003

J. Mater. Chem., 2003,13, 2525-2529

Growth control and characterization of vertically aligned IrO2 nanorods

R. Chen, Y. Huang, Y. Liang, D. Tsai, Y. Chi and J. Kai, J. Mater. Chem., 2003, 13, 2525 DOI: 10.1039/B305602N

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