Measuring surface stress induced by electrode processes using a micromechanical sensor

Abstract

Sensitive and fast sensors can be constructed from atomic force microscope (AFM) cantilevers for studies of interfacial processes such as adsorption and reconstruction. We have constructed a surface stress sensor with submonolayer sensitivity for use in electrochemistry, whereby simultaneous cyclic voltammograms and stress changes can be recorded. This is demonstrated with measurements of the electrocapillary curve of gold, and the stress changes associated with the underpotential deposition of silver on gold(111).