Issue 33, 2012

Nitrogen defects in wide band gap oxides: defect equilibria and electronic structure from first principles calculations

Abstract

The nitrogen related defect chemistry and electronic structure of wide band gap oxides are investigated by density functional theory defect calculations of NqO, NH×O, and Image ID:c2cp41378g-t1.gif as well as Image ID:c2cp41378g-t2.gif and Image ID:c2cp41378g-t3.gif in MgO, CaO, SrO, Al2O3, In2O3, Sc2O3, Y2O3, La2O3, TiO2, SnO2, ZrO2, BaZrO3, and SrZrO3. The NqO acceptor level is found to be deep and the binding energy of NH×O with respect to Image ID:c2cp41378g-t4.gif and Image ID:c2cp41378g-t5.gif is found to be significantly negative, i.e. binding, in all of the investigated oxides. The defect structure of the oxides was found to be remarkably similar under reducing and nitriding conditions (1 bar N2, 1 bar H2 and 1 × 10−7 bar H2O): NH×O predominates at low temperatures and Image ID:c2cp41378g-t6.gif predominates at higher temperatures (>900 K for most of the oxides). Furthermore, we evaluate how the defect structure is affected by non-equilibrium conditions such as doping and quenching. In terms of electronic structure, Image ID:c2cp41378g-t7.gif is found to introduce isolated N-2p states within the band gap, while the N-2p states of NH×O are shifted towards, or overlap with the VBM. Finally, we assess the effect of nitrogen incorporation on the proton conducting properties of oxides and comment on their corrosion resistance in nitriding atmospheres in light of the calculated defect structures.

Graphical abstract: Nitrogen defects in wide band gap oxides: defect equilibria and electronic structure from first principles calculations

Article information

Article type
Paper
Submitted
30 Apr 2012
Accepted
20 Jun 2012
First published
20 Jun 2012

Phys. Chem. Chem. Phys., 2012,14, 11808-11815

Nitrogen defects in wide band gap oxides: defect equilibria and electronic structure from first principles calculations

J. M. Polfus, T. S. Bjørheim, T. Norby and R. Haugsrud, Phys. Chem. Chem. Phys., 2012, 14, 11808 DOI: 10.1039/C2CP41378G

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