Issue 44, 2015

Highly reliable switching via phase transition using hydrogen peroxide in homogeneous and multi-layered GaZnOx-based resistive random access memory devices

Abstract

Here, we propose an effective method for improving the resistive switching characteristics of solution-processed gallium-doped zinc oxide (GaZnOx) resistive random access memory (RRAM) devices using hydrogen peroxide. Our results imply that solution processed GaZnOx RRAM devices could be one of the candidates for the development of low cost RRAM.

Graphical abstract: Highly reliable switching via phase transition using hydrogen peroxide in homogeneous and multi-layered GaZnOx-based resistive random access memory devices

Supplementary files

Article information

Article type
Communication
Submitted
21 Dec 2014
Accepted
23 Apr 2015
First published
27 Apr 2015
This article is Open Access
Creative Commons BY-NC license

Chem. Commun., 2015,51, 9173-9176

Author version available

Highly reliable switching via phase transition using hydrogen peroxide in homogeneous and multi-layered GaZnOx-based resistive random access memory devices

S. P. Park, D. H. Yoon, Y. J. Tak, H. Lee and H. J. Kim, Chem. Commun., 2015, 51, 9173 DOI: 10.1039/C4CC10209F

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