Issue 7, 2004

UV photopatterning of a highly metallized, cluster-containing poly(ferrocenylsilane)

Abstract

Thin films of a cobalt-clusterized poly(ferrocenylsilane) have been shown to behave as a negative-tone resist for UV photolithography, allowing access to feature sizes between 20 and 300 µm. Pyrolysis of the patterned polymer at 900 °C under a N2 atmosphere afforded patterned ferromagnetic ceramics with excellent shape retention.

Graphical abstract: UV photopatterning of a highly metallized, cluster-containing poly(ferrocenylsilane)

Article information

Article type
Communication
Submitted
23 Dec 2003
Accepted
06 Feb 2004
First published
03 Mar 2004

Chem. Commun., 2004, 780-781

UV photopatterning of a highly metallized, cluster-containing poly(ferrocenylsilane)

A. Y. Cheng, S. B. Clendenning, G. Yang, Z. Lu, C. M. Yip and I. Manners, Chem. Commun., 2004, 780 DOI: 10.1039/B316656B

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