Overview of Characterization Technique Groups for Submicroscopic Structure from Micro-Nano-to-Atomic Scale

Abstract

Structural characterization is essentially important for chemistry and materials science research, especially the submicroscopic characterization from micro-nano to atomic scale, which is the powerful tool foundation for investigating and understanding the properties, functions, and establishing structure-activity relationships. This review details the advanced submicroscopic characterization technique group based on the main line of material structure, encompassing both physical and chemical aspects toward functional solid materials, such as morphologies, pore structures, crystal structures, chemical compositions, oxidation states, coordination and electron structures based on the equipment of SEM, AC-STEM, surface adsorption instrument, XRD, EDS, XPS, XAFS, EELS, NMR and Mössbauer spectroscopy etc. To track their dynamic evolution of above-mentioned structures during various applications, the in situ or operando characterization methodologies and equipment are further extensively discussed. Organizing these technologies into a coordinated group not only provides comprehensive references for researchers in the fields of chemistry, materials science, and energy, but also advances research and establishes technical foundations for novel functional material discovery.