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Structural and electrical properties of lanthanum copper oxide epitaxial thin films with different domain morphologies

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Abstract

Herein, we investigated the domain morphologies of defect-perovskite LaCuOx (2.5 ≤ x ≤ 3.0) thin films grown on cubic SrTiO3 (100) and orthorhombic NdGaO3 (110) substrates by pulsed-laser deposition. Both films were composed of narrow rectangular-shaped domains, which extended in the [001] direction of LaCuOx. The LaCuOx film grown on SrTiO3 showed a labyrinth-like domain pattern composed of 90° domains, whereas the film on NdGaO3 displayed a stripe pattern with 180° domains. Furthermore, we observed anisotropy in the resistivity; the resistivity along the length of the domains was about three times lower than that across their width. This indicated that the domain boundaries behaved as carrier scattering centers.

Graphical abstract: Structural and electrical properties of lanthanum copper oxide epitaxial thin films with different domain morphologies

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Publication details

The article was received on 12 May 2018, accepted on 20 Jul 2018 and first published on 10 Aug 2018


Article type: Paper
DOI: 10.1039/C8CE00777B
Citation: CrystEngComm, 2018, Advance Article
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    Structural and electrical properties of lanthanum copper oxide epitaxial thin films with different domain morphologies

    T. Onozuka, A. Chikamatsu, Y. Hirose and T. Hasegawa, CrystEngComm, 2018, Advance Article , DOI: 10.1039/C8CE00777B

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