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Issue 34, 2017
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Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy

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Abstract

Nanomaterials can be identified in high-resolution electron microscopy images using spectrally-selective cathodoluminescence. Capabilities for multiplex detection can however be limited, e.g., due to spectral overlap or availability of filters. Also, the available photon flux may be limited due to degradation under electron irradiation. Here, we demonstrate single-pass cathodoluminescence-lifetime based discrimination of different nanoparticles, using a pulsed electron beam. We also show that cathodoluminescence lifetime is a robust parameter even when the nanoparticle cathodoluminescence intensity decays over an order of magnitude. We create lifetime maps, where the lifetime of the cathodoluminescence emission is correlated with the emission intensity and secondary-electron images. The consistency of lifetime-based discrimination is verified by also correlating the emission wavelength and the lifetime of nanoparticles. Our results show how cathodoluminescence lifetime provides an additional channel of information in electron microscopy.

Graphical abstract: Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy

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Publication details

The article was received on 07 Feb 2017, accepted on 10 Aug 2017 and first published on 18 Aug 2017


Article type: Paper
DOI: 10.1039/C7NR00927E
Citation: Nanoscale, 2017,9, 12727-12734
  • Open access: Creative Commons BY-NC license
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    Nanoparticle discrimination based on wavelength and lifetime-multiplexed cathodoluminescence microscopy

    M. W. H. Garming, I. G. C. Weppelman, P. de Boer, F. P. Martínez, R. Schirhagl, J. P. Hoogenboom and R. J. Moerland, Nanoscale, 2017, 9, 12727
    DOI: 10.1039/C7NR00927E

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