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Issue 13, 2017
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Evidence of a minority monoclinic LaNiO2.5 phase in lanthanum nickelate thin films

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Abstract

LaNiO3 (LNO) thin films of 14 nm and 35 nm thicknesses grown epitaxially on LaAlO3 (LAO) and (LaAlO3)0.3(Sr2TaAlO6)0.7 (LSAT) substrates are studied using High Resolution Transmission Electron Microscopy (HRTEM) and High Angle Annular Dark Field (HAADF) imaging. The strain state of the films is studied using Geometric Phase Analysis (GPA). Results show the successful in-plane adaptation of the films to the substrates, both in the compressive (LAO) and tensile (LSAT) cases. Through the systematic analysis of HRTEM superstructure contrast modulation along different crystal orientations, localized regions of the monoclinic LaNiO2.5 phase are detected in the 35 nm films.

Graphical abstract: Evidence of a minority monoclinic LaNiO2.5 phase in lanthanum nickelate thin films

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Publication details

The article was received on 10 Feb 2017, accepted on 07 Mar 2017 and first published on 07 Mar 2017


Article type: Paper
DOI: 10.1039/C7CP00902J
Citation: Phys. Chem. Chem. Phys., 2017,19, 9137-9142
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    Evidence of a minority monoclinic LaNiO2.5 phase in lanthanum nickelate thin films

    L. López-Conesa, J. M. Rebled, D. Pesquera, N. Dix, F. Sánchez, G. Herranz, J. Fontcuberta, C. Magén, M. J. Casanove, S. Estradé and F. Peiró, Phys. Chem. Chem. Phys., 2017, 19, 9137
    DOI: 10.1039/C7CP00902J

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