Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

A. Bhattarai; P. Z. El-Khoury

doi:10.1039/C7CC02593A

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Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering†

A. Bhattarai^a and P. Z. El-Khoury

*^a

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* Corresponding authors

^a Physical Sciences Division, Pacific Northwest National Laboratory, P.O. Box 999, Richland, WA 99352, USA
E-mail: patrick.elkhoury@pnnl.gov

Abstract

Tip-enhanced Raman scattering (TERS) can be used to image plasmon-enhanced local electric field variations with extremely high spatial resolution under ambient conditions. This is illustrated through TERS images recorded using a silver atomic force microscope tip coated with strategically selected molecular reporters and used to image a sputtered silver film.

This article is part of the themed collection: 2017 Emerging Investigators

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Article information

DOI: https://doi.org/10.1039/C7CC02593A
Article type: Communication
Submitted: 05 Apr 2017
Accepted: 28 Apr 2017
First published: 05 May 2017

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Chem. Commun., 2017,53, 7310-7313

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Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

A. Bhattarai and P. Z. El-Khoury, Chem. Commun., 2017, 53, 7310 DOI: 10.1039/C7CC02593A

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Chemical Communications

Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering†

Abstract

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Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

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