Characterization of nanoporous structures: from three dimensions to two dimensions

Cang Zhao; Yu Qiao

doi:10.1039/C6NR05862K

Characterization of nanoporous structures: from three dimensions to two dimensions

Cang Zhao*^a^b and Yu Qiao^a^c

Author affiliations

* Corresponding authors

^a Department of Structural Engineering, University of California - San Diego, La Jolla, USA

^b X-ray Science Division, Argonne National Laboratory, Argonne, USA
E-mail: cang.zhao@aps.anl.gov
Tel: +1-630-252-1848

^c Program of Materials Science and Engineering, University of California - San Diego, La Jolla, USA

Abstract

The scanning electron microscope (SEM) has revealed a colorful three-dimensional world due to its great depth of field. However, the abundance of structural information imposes tough challenges to quantitative image analysis. In the current investigation, we developed a SEM-image polishing (SIP) based quantitative SEM-image analysis (QSIA) technique. As an example, QSIA was employed to characterize nanoporous silica. The results confirmed that the nanoporous silica samples, processed via sol–gel methods, were single-parameter, with the pore size being the only variable. The QSIA technique may pave the way to fast and accurate data mining of nanoscaled materials.

Supplementary files

Publication details

The article was received on 25 Jul 2016, accepted on 18 Sep 2016 and first published on 19 Sep 2016

Article type: Paper

DOI: 10.1039/C6NR05862K

Citation: Nanoscale, 2016,8, 17658-17664

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Characterization of nanoporous structures: from three dimensions to two dimensions

C. Zhao and Y. Qiao, Nanoscale, 2016, 8, 17658
DOI: 10.1039/C6NR05862K
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Nanoscale

Characterization of nanoporous structures: from three dimensions to two dimensions

Abstract

Supplementary files

Publication details

Characterization of nanoporous structures: from three dimensions to two dimensions

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