Jump to main content
Jump to site search

Issue 11, 2016
Previous Article Next Article

High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires

Author affiliations

Abstract

Existing nanowire electrical characterization tools not only are expensive and require sophisticated facilities, but are far too slow to enable statistical characterization of highly variable samples. They are also generally not compatible with further sorting and processing of nanowires. Here, we demonstrate a high-throughput, solution-based electro-orientation-spectroscopy (EOS) method, which is capable of automated electrical characterization of individual nanowires by direct optical visualization of their alignment behavior under spatially uniform electric fields of different frequencies. We demonstrate that EOS can quantitatively characterize the electrical conductivities of nanowires over a 6-order-of-magnitude range (10−5 to 10 S m−1, corresponding to typical carrier densities of 1010–1016 cm−3), with different fluids used to suspend the nanowires. By implementing EOS in a simple microfluidic device, continuous electrical characterization is achieved, and the sorting of nanowires is demonstrated as a proof-of-concept. With measurement speeds two orders of magnitude faster than direct-contact methods, the automated EOS instrument enables for the first time the statistical characterization of highly variable 1D nanomaterials.

Graphical abstract: High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires

Back to tab navigation

Supplementary files

Publication details

The article was received on 16 Feb 2016, accepted on 04 May 2016 and first published on 12 May 2016


Article type: Paper
DOI: 10.1039/C6LC00217J
Author version available: Download Author version (PDF)
Citation: Lab Chip, 2016,16, 2126-2134
  •   Request permissions

    High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires

    C. Akin, L. C. Feldman, C. Durand, S. M. Hus, A. Li, H. Y. Hui, M. A. Filler, J. Yi and J. W. Shan, Lab Chip, 2016, 16, 2126
    DOI: 10.1039/C6LC00217J

Search articles by author

Spotlight

Advertisements