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Physical Chemistry Chemical Physics

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Paper

Quantitative parameters for the examination of InGaN QW multilayers by low-loss EELS

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Corresponding authors
a
LENS-MIND-IN2UB, Laboratory of Electron NanoScopies, Departament d'Electrónica, Universitat de Barcelona, Barcelona, Spain
E-mail: aeljarrat@el.ub.edu
b
LMA-INA Laboratorio de Microscopías Avanzadas, Instituto de Nanociencia de Aragón – ARAID, Departamento de Física de la Materia Condensada, Universidad de Zaragoza, 50018 Zaragoza, Spain
c
ISOM, Instituto de Sistemas Optoelectrónicos y Microtecnología, Universidad Politécnica de Madrid, Madrid, Spain
Phys. Chem. Chem. Phys., 2016,18, 23264-23276

DOI: 10.1039/C6CP04493J
Received 27 Jun 2016, Accepted 02 Aug 2016
First published online 02 Aug 2016
This article is licensed under a Creative Commons Attribution 3.0 Unported Licence.
Open Access
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