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Issue 58, 2015
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Detecting the hollow structure of thick carbon nanotubes by scanning transmission X-ray microscopy

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Abstract

Scanning transmission X-ray microscopy (STXM) combined with an identical region in transmission electron microscopy (TEM) image has been used to detect the interior structure of individual thick multi-walled carbon nanotubes (MWCNTs). Two individual MWCNTs show similar morphology and diameters from the TEM images, while from the STXM spectra their interior structures have significantly different hollow parts. Moreover, the different hollow structures result in obviously different electronic structures which can be detected by X-ray absorption spectroscopy. Our results show an effective way to measure the inside hollow structure of thick MWCNTs.

Graphical abstract: Detecting the hollow structure of thick carbon nanotubes by scanning transmission X-ray microscopy

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Publication details

The article was received on 02 Apr 2015, accepted on 21 May 2015 and first published on 22 May 2015


Article type: Paper
DOI: 10.1039/C5RA05850C
Citation: RSC Adv., 2015,5, 46904-46907
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    Detecting the hollow structure of thick carbon nanotubes by scanning transmission X-ray microscopy

    G. Zhao, J. Wang, X. Sun and J. Zhong, RSC Adv., 2015, 5, 46904
    DOI: 10.1039/C5RA05850C

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