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Volume 177, 2015
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Disentangling detector data in XFEL studies of temporally resolved solution state chemistry

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Abstract

With the arrival of X-ray Free Electron Lasers (XFELs), 2D area detectors with a large dynamic range for detection of hard X-rays with fast readout rates are required for many types of experiments. Extracting the desired information from these detectors has been challenging due to unpredicted fluctuations in the measured images. For techniques such as time-resolved X-ray Diffuse Scattering (XDS), small differences in signal intensity are the starting point for analysis. Fluctuations in the total detected signal remain in the differences under investigation, obfuscating the signal. To correct such artefacts, Singular Value Decomposition (SVD) can be used to identify and characterize the observed detector fluctuations and assist in assigning some of them to variations in physical parameters such as X-ray energy and X-ray intensity. This paper presents a methodology for robustly identifying, separating and correcting fluctuations on area detectors based on XFEL beam characteristics, to enable the study of temporally resolved solution state chemistry on the femtosecond timescale.

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Publication details

The article was received on 14 Oct 2014, accepted on 05 Nov 2014 and first published on 12 Feb 2015


Article type: Paper
DOI: 10.1039/C4FD00203B
Citation: Faraday Discuss., 2015,177, 443-465
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    Disentangling detector data in XFEL studies of temporally resolved solution state chemistry

    T. B. van Driel, K. S. Kjær, E. Biasin, K. Haldrup, H. T. Lemke and M. M. Nielsen, Faraday Discuss., 2015, 177, 443
    DOI: 10.1039/C4FD00203B

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