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Issue 6, 2014
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Optical near-field excitation at commercial scanning probe microscopy tips: a theoretical and experimental investigation

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Abstract

A systematic study of the influence of the excitation angle, the light polarization and the coating thickness of commercial SPM tips on the field enhancement in an apertureless scanning near-field optical microscope is presented. A new method to optimize the alignment of the electric field vector along the major tip axis by measuring the resonance frequency was developed. The simulations were performed with a MNPBEM toolbox based on the Boundary Element Method (BEM). The influence of the coating thickness was investigated for the first time. Coatings below 40 nm showed a drastic influence both on the resonance wavelength and the enhancement. A shift to higher angles of incidence for the maximum enhancement could be observed for greater tip radii.

Graphical abstract: Optical near-field excitation at commercial scanning probe microscopy tips: a theoretical and experimental investigation

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Publication details

The article was received on 23 Apr 2013, accepted on 12 Sep 2013 and first published on 13 Sep 2013


Article type: Paper
DOI: 10.1039/C3CP51730F
Citation: Phys. Chem. Chem. Phys., 2014,16, 2289-2296
  • Open access: Creative Commons BY license
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    Optical near-field excitation at commercial scanning probe microscopy tips: a theoretical and experimental investigation

    C. Huber, A. Trügler, U. Hohenester, Y. Prior and W. Kautek, Phys. Chem. Chem. Phys., 2014, 16, 2289
    DOI: 10.1039/C3CP51730F

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