Issue 18, 2013

Functionalized ZnO nanoparticles for thin-film transistors: support of ligand removal by non-thermal methods

Abstract

A new approach is presented which allows substantial reduction of the process temperature of zinc oxide nanoparticles to generate semiconducting thin films. Functionalization is used to allow facile dispersion and to prevent agglomeration of the particles. Since charge transport is impeded by an insulating shell of octylamine the functionalization needs to be removed. Particles are deposited by spin-coating and the resulting film is exposed to different treatments. It is shown that plain annealing processes require high temperatures to fully remove the capping agents. The method presented in this work is a combination of UV irradiation of the wet films before annealing to cleave the octylamine and a vacuum process to aid the removal of organic residues. The effectiveness of the method is proven by electrical characterization.

Graphical abstract: Functionalized ZnO nanoparticles for thin-film transistors: support of ligand removal by non-thermal methods

Supplementary files

Article information

Article type
Paper
Submitted
07 Nov 2012
Accepted
18 Mar 2013
First published
18 Mar 2013

J. Mater. Chem. C, 2013,1, 3098-3103

Functionalized ZnO nanoparticles for thin-film transistors: support of ligand removal by non-thermal methods

D. Weber, S. Botnaraş, D. V. Pham, J. Steiger and L. De Cola, J. Mater. Chem. C, 2013, 1, 3098 DOI: 10.1039/C3TC00576C

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