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Paper

Non-volatile hybrid memory devices with excellent reliability

Dae Sung Chung,*a   Il Kang,b   Soon-Ki Kwon*b and   Yun-Hi Kim*c  
*
Corresponding authors
a
School of Chemical Engineering and Material Science, Chung-Ang University, Seoul, Korea
E-mail: dchung@cau.ac.kr
Fax: +82-2-817-9131
Tel: +82-2-820-5270
b
School of Materials Science and Engineering, Research Institute for Green Energy Convergence Technology (REGET), Gyeongsang National University, Jinju, Korea
E-mail: skwon@gnu.ac.kr
c
Department of Chemistry, Gyeongsang National University, Jinju, Korea
E-mail: ykim@gnu.ac.kr
RSC Adv., 2013,3, 13156-13162

DOI: 10.1039/C3RA41511B
Received 28 Mar 2013, Accepted 03 Jun 2013
First published online 04 Jun 2013
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