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Issue 13, 2013
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Sliding and rolling frictional behavior of a single ZnO nanowire during manipulation with an AFM

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Abstract

The frictional behavior during manipulation of a single ZnO nanowire with a mass of about 18.7 ng placed horizontally on a Si wafer was examined using atomic force microscopy (AFM). The frictional force measured was in the range of 36.4 nN to 69.3 nN, which corresponded to extremely high friction coefficients of 242 and 462, respectively. However, when the adhesion force of the nanowire was considered, the friction coefficients were similar to the values typically encountered in macro-scale systems. During manipulation of the nanowire, both rolling and sliding motions were observed depending on the nanowire–Si frictional interaction. Unlike macro-scale systems, the difference between the frictional forces of rolling/sliding and pure sliding motions of the nanowire was not drastic.

Graphical abstract: Sliding and rolling frictional behavior of a single ZnO nanowire during manipulation with an AFM

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Publication details

The article was received on 10 Dec 2012, accepted on 23 Apr 2013, published on 29 May 2013 and first published online on 29 May 2013


Article type: Paper
DOI: 10.1039/C3NR34029E
Citation: Nanoscale, 2013,5, 6081-6087
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    Sliding and rolling frictional behavior of a single ZnO nanowire during manipulation with an AFM

    H. Kim, K. H. Kang and D. Kim, Nanoscale, 2013, 5, 6081
    DOI: 10.1039/C3NR34029E

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