Issue 20, 2013

3D assembly of upconverting NaYF4nanocrystals by AFM nanoxerography: creation of anti-counterfeiting microtags

Abstract

Formation of 3D close-packed assemblies of upconverting NaYF4 colloidal nanocrystals (NCs) on surfaces, by Atomic Force Microscopy (AFM) nanoxerography is presented. The surface potential of the charge patterns, the NC concentration, the polarizability of the NCs and the polarity of the dispersing solvent are identified as the key parameters controlling the assembly of NaYF4 NCs into micropatterns of the desired 3D architecture. This insight allowed us to fabricate micrometer sized Quick Response (QR) codes encoded in terms of upconversion luminescence intensity or color. Topographically hidden messages could also be readily incorporated within these microtags. This work demonstrates that AFM nanoxerography has enormous potential for generating high-security anti-counterfeiting microtags.

Graphical abstract: 3D assembly of upconverting NaYF4 nanocrystals by AFM nanoxerography: creation of anti-counterfeiting microtags

Supplementary files

Article information

Article type
Communication
Submitted
26 May 2013
Accepted
27 Jul 2013
First published
01 Aug 2013

Nanoscale, 2013,5, 9587-9592

3D assembly of upconverting NaYF4 nanocrystals by AFM nanoxerography: creation of anti-counterfeiting microtags

N. M. Sangeetha, P. Moutet, D. Lagarde, G. Sallen, B. Urbaszek, X. Marie, G. Viau and L. Ressier, Nanoscale, 2013, 5, 9587 DOI: 10.1039/C3NR02734A

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