Jump to main content
Jump to site search

Issue 20, 2013
Previous Article Next Article

3D assembly of upconverting NaYF4 nanocrystals by AFM nanoxerography: creation of anti-counterfeiting microtags

Author affiliations

Abstract

Formation of 3D close-packed assemblies of upconverting NaYF4 colloidal nanocrystals (NCs) on surfaces, by Atomic Force Microscopy (AFM) nanoxerography is presented. The surface potential of the charge patterns, the NC concentration, the polarizability of the NCs and the polarity of the dispersing solvent are identified as the key parameters controlling the assembly of NaYF4 NCs into micropatterns of the desired 3D architecture. This insight allowed us to fabricate micrometer sized Quick Response (QR) codes encoded in terms of upconversion luminescence intensity or color. Topographically hidden messages could also be readily incorporated within these microtags. This work demonstrates that AFM nanoxerography has enormous potential for generating high-security anti-counterfeiting microtags.

Graphical abstract: 3D assembly of upconverting NaYF4 nanocrystals by AFM nanoxerography: creation of anti-counterfeiting microtags

Back to tab navigation

Supplementary files

Publication details

The article was received on 26 May 2013, accepted on 27 Jul 2013 and first published on 01 Aug 2013


Article type: Communication
DOI: 10.1039/C3NR02734A
Citation: Nanoscale, 2013,5, 9587-9592
  •   Request permissions

    3D assembly of upconverting NaYF4 nanocrystals by AFM nanoxerography: creation of anti-counterfeiting microtags

    N. M. Sangeetha, P. Moutet, D. Lagarde, G. Sallen, B. Urbaszek, X. Marie, G. Viau and L. Ressier, Nanoscale, 2013, 5, 9587
    DOI: 10.1039/C3NR02734A

Search articles by author

Spotlight

Advertisements