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A high impact peer reviewed journal publishing experimental and theoretical work across the breadth of nanoscience and nanotechnology
Impact Factor 7.394 48 Issues per Year
Review Article

Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

Corresponding authors
Laboratory of Nano-Bioengineering, National Research Nuclear University, Moscow Engineering Physics Institute, 31 Kashirskoe sh., 115409 Moscow, Russian Federation
Institute for Physico-Chemical Problems, Belarusian State University, 220050 Minsk, Belarus
Laboratory of Bionanotechnology, Shumakov Federal Research Center of Transplantology and Artificial Organs, Moscow, Russian Federation
SNOTRA LLC, Moscow, Russian Federation
European Technological Platform Semiconductor Nanocrystals, Institute of Molecular Medicine, Trinity College Dublin, James's Street, Dublin 8, Ireland
Laboratory of Research in Nanosciences – EA4682, Université de Reims Champagne-Ardenne, 51100 Reims, France
Nanoscale, 2013,5, 8781-8798

DOI: 10.1039/C3NR02372A
Received 08 May 2013, Accepted 12 Jul 2013
First published online 16 Jul 2013
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