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Issue 10, 2013
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Atomic resolution imaging of graphene by transmission electron microscopy

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Abstract

The atomic structure of a material influences its electronic, chemical, magnetic and mechanical properties. Characterising carbon nanomaterials, such as fullerenes, nanotubes and graphene, at the atomic level is challenging due to their chemical reactivity and low atomic mass. Transmission electron microscopy and scanning probe microscopy are two of the leading methods for imaging graphene at the atomic level. Here, we report on recent advances in atomic resolution imaging of graphene using aberration-corrected high resolution transmission electron microscopy and how it has revealed many of the structural deviations from the pristine monolayer form. Structures in graphene such as vacancy defects, edges, grain boundaries, linear chains, impurity dopants, layer number, layer stacking and bond rotations are explored.

Graphical abstract: Atomic resolution imaging of graphene by transmission electron microscopy

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Publication details

The article was received on 22 Feb 2013, accepted on 26 Mar 2013 and first published on 18 Apr 2013


Article type: Feature Article
DOI: 10.1039/C3NR00934C
Citation: Nanoscale, 2013,5, 4079-4093
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    Atomic resolution imaging of graphene by transmission electron microscopy

    A. W. Robertson and J. H. Warner, Nanoscale, 2013, 5, 4079
    DOI: 10.1039/C3NR00934C

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