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Issue 19, 2013
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Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

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Abstract

Fabrication of modern nanomaterials and nanostructures with specific functional properties is both scientifically promising and commercially profitable. The preparation and use of nanomaterials require adequate methods for the control and characterization of their size, shape, chemical composition, crystalline structure, energy levels, pathways and dynamics of physical and chemical processes during their fabrication and further use. In this review, we discuss different instrumental methods for the analysis and metrology of materials and evaluate their advantages and limitations at the nanolevel.

Graphical abstract: Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

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Publication details

The article was received on 08 May 2013, accepted on 12 Jul 2013 and first published on 16 Jul 2013


Article type: Review Article
DOI: 10.1039/C3NR02372A
Citation: Nanoscale, 2013,5, 8781-8798
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    Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

    P. Linkov, M. Artemyev, A. E. Efimov and I. Nabiev, Nanoscale, 2013, 5, 8781
    DOI: 10.1039/C3NR02372A

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