Jump to main content
Jump to site search

Issue 34, 2013
Previous Article Next Article

Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

Author affiliations

Abstract

Several techniques can be applied to characterize redox properties of wide bandgap semiconductors, however some of them are of limited use. In this paper we propose a new modification of the old spectroelectrochemical method developed two decades ago. A procedure based on measurements of the reflectance changes as a function of potential applied to the electrode coated with the studied material appears to be a very convenient tool for characterizing redox properties of semiconductors, forming either transparent or opaque films at a platinum electrode. A discussion on the measured redox parameters of semiconductor films concludes with a definition of a new term, the absorption onset potential of the material.

Graphical abstract: Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

Back to tab navigation

Publication details

The article was received on 20 May 2013, accepted on 03 Jul 2013 and first published on 04 Jul 2013


Article type: Paper
DOI: 10.1039/C3CP52129J
Citation: Phys. Chem. Chem. Phys., 2013,15, 14256-14261
  •   Request permissions

    Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

    E. Świętek, K. Pilarczyk, J. Derdzińska, K. Szaciłowski and W. Macyk, Phys. Chem. Chem. Phys., 2013, 15, 14256
    DOI: 10.1039/C3CP52129J

Search articles by author

Spotlight

Advertisements