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Issue 22, 2013
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A time resolved high energy X-ray diffraction study of cooling liquid SiO2

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Abstract

The evolution of the X-ray structure factor and corresponding pair distribution function of SiO2 has been measured upon cooling from the melt using high energy X-ray diffraction combined with aerodynamic levitation. Small changes in the position of the average Si–O bond distance and peak width are found to occur at ∼1500(100) K in the region of the calorimetric glass transition temperature, Tg and the observed density minima. At higher temperatures deviations from linear behavior are seen in the first sharp diffraction peak width, height and area at around 1750(50) K, which coincides with the reported density maximum around 1.2Tg.

Graphical abstract: A time resolved high energy X-ray diffraction study of cooling liquid SiO2

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Publication details

The article was received on 04 Dec 2012, accepted on 03 Apr 2013 and first published on 05 Apr 2013


Article type: Paper
DOI: 10.1039/C3CP44347G
Citation: Phys. Chem. Chem. Phys., 2013,15, 8566-8572
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    A time resolved high energy X-ray diffraction study of cooling liquid SiO2

    L. B. Skinner, C. J. Benmore, J. K. R. Weber, M. C. Wilding, S. K. Tumber and J. B. Parise, Phys. Chem. Chem. Phys., 2013, 15, 8566
    DOI: 10.1039/C3CP44347G

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