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Issue 15, 2013
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Improving correlated SERS measurements with scanning electron microscopy: an assessment of the problem arising from the deposition of amorphous carbon

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Abstract

For surface-enhanced Raman scattering (SERS) substrates with nonspherical symmetry, it is critical to correlate spectroscopy measurements with imaging by scanning electron microscopy (SEM). However, the deposition of carbon resulting from e-beam exposure during SEM imaging contaminates the surface of nanoparticles, potentially preventing their further functionalization with Raman probe molecules. In addition, the deposited carbon leads to unwanted background SERS signals. In this study, we systematically investigated the deposition of carbon during SEM imaging and examined how it affects the functionalization of nanoparticles with probe molecules and impacts the detection of SERS signals. Significantly, we found that the carbon could be removed or replaced from the surface of Ag nanoparticles through chemical or physical means, rendering the nanoparticles the capability for correlated SEM/SERS studies.

Graphical abstract: Improving correlated SERS measurements with scanning electron microscopy: an assessment of the problem arising from the deposition of amorphous carbon

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Publication details

The article was received on 08 Nov 2012, accepted on 29 Jan 2013 and first published on 30 Jan 2013


Article type: Paper
DOI: 10.1039/C3CP43989E
Citation: Phys. Chem. Chem. Phys., 2013,15, 5400-5406
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    Improving correlated SERS measurements with scanning electron microscopy: an assessment of the problem arising from the deposition of amorphous carbon

    C. H. Moran, X. Xia and Y. Xia, Phys. Chem. Chem. Phys., 2013, 15, 5400
    DOI: 10.1039/C3CP43989E

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