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Communication

Electric field induced DNA damage: an open door for selective mutations

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Corresponding authors
a
CEISAM, UMR CNRS 6230, BP 92208, Université de Nantes, 2, Rue de la Houssinière, 44322 Nantes Cedex 3, France
E-mail: Jose.Ceron@univ-nantes.fr
Fax: +33 (0)2 5112 5567
Tel: +33 (0)276645173
b
Institut Universitaire de France, 103 bd St Michel, 75005 Paris Cedex 5, France
E-mail: Denis.Jacquemin@univ-nantes.fr
Chem. Commun., 2013,49, 7578-7580

DOI: 10.1039/C3CC42593B
Received 09 Apr 2013, Accepted 13 May 2013
First published online 14 May 2013
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