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Paper

Prolonged exposure of graphite oxide to soft X-ray irradiation during XPS measurements leads to alterations of the chemical composition

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Corresponding authors
a
Division of Chemistry & Biological Chemistry, School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore 637371, Singapore
E-mail: pumera@ntu.edu.sg, pumera@outlook.com
Fax: +65 67911961
Analyst, 2013,138, 7012-7015

DOI: 10.1039/C3AN00981E
Received 16 May 2013, Accepted 06 Sep 2013
First published online 04 Oct 2013
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