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Harnessing snap-through instability in soft dielectrics to achieve giant voltage-triggered deformation

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Corresponding authors
Soft Matter Physics, Johannes Kepler University, Altenbergerstrasse 69, Linz, Austria
E-mail: sbauer@jku.at
School of Engineering and Applied Sciences, Harvard University, Cambridge, USA
E-mail: suo@seas.harvard.edu
Institute of Applied Mechanics, Zhejiang University, 38 Zheda Road, Hangzhou, China
Soft Matter, 2012,8, 285-288

DOI: 10.1039/C1SM06736B
Received 13 Sep 2011, Accepted 07 Oct 2011
First published online 28 Oct 2011
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