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Impact of point defects on electronic structure in Y2Ti2O7

Haiyan Xiao,*a   Yanwen Zhangba and   William J. Weberab  
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Corresponding authors
a
Department of Materials Science & Engineering, University of Tennessee, Knoxville, USA
E-mail: hxiao@utk.edu
b
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, USA
RSC Adv., 2012,2, 7235-7240

DOI: 10.1039/C2RA21099A
Received 31 May 2012, Accepted 31 May 2012
First published online 13 Jun 2012
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