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Issue 10, 2012
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Nanoionic transport and electrochemical reactions in resistively switching silicon dioxide

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Abstract

The mobility of copper ions and redox reactions of Cu at the interface with SiO2 being directly attributed to the resistive switching effect have been studied by cyclic voltammetry (CV). The electrode kinetics of the Cuz+/Cu redox reactions were analyzed suggesting the formation of both Cu+ and Cu2+ species. The ion mobility shows an unexpected strong dependence on the ion concentration indicating ion–ion interactions typical for concentrated solution conditions. Based on the standard reduction potentials for Cuz+/Cu we identified partial electrochemical redox reactions during oxidation and reduction. The results contribute to a detailed understanding of the resistive switching effect in Cu/SiO2/Pt cells and provide insight into electrochemically assisted diffusion of metal cations in oxides in general.

Graphical abstract: Nanoionic transport and electrochemical reactions in resistively switching silicon dioxide

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Publication details

The article was received on 21 Feb 2012, accepted on 21 Mar 2012 and first published on 26 Mar 2012


Article type: Communication
DOI: 10.1039/C2NR30413A
Citation: Nanoscale, 2012,4, 3040-3043
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    Nanoionic transport and electrochemical reactions in resistively switching silicon dioxide

    S. Tappertzhofen, H. Mündelein, I. Valov and R. Waser, Nanoscale, 2012, 4, 3040
    DOI: 10.1039/C2NR30413A

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