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Issue 10, 2012
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Atomic spectrometry update—X-ray fluorescence spectrometry

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This review demonstrates advances in XRF instrumentation, techniques and data processing algorithms published during the last year. Pixellated detectors and EDXRF imaging/mapping using a variety of materials and readout technologies have set a trend that will undoubtedly continue due to improved sensor array fabrication and readout devices that are now more widely available. Instrumental development took place at synchrotron beamlines with reports that described the measurement and data processing methodologies for use with combinations of μ-analytical techniques (μ-SRXRF, μ-XANES and μ-PIXE) that offer chemical imaging to researchers interested in spatial distribution and speciation of elements within plants and cell tissue for environmental studies and medical diagnostics. Archaeological and cultural heritage applications similarly benefit with insight of the original fabrication or subsequent alteration of artefacts. Although recent developments in hand-held instrumentation have substantially improved the capabilities of this form of XRF, advances in instrumentation continue to be reported. TXRF is a growing analytical technique with systematic studies in sample preparation, sample shape and influence of absorption on both the incident and fluorescent radiation bringing benefits for the analysis of environmental samples. A new method of elemental depth profiling has been developed and the corrosion process has been characterised with an unprecedented level of detail. A large proportion of geological studies focused on evidence for climate and environmental change over geological time periods.

Graphical abstract: Atomic spectrometry update—X-ray fluorescence spectrometry

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The article was received on 18 Jul 2012, accepted on 18 Jul 2012 and first published on 07 Aug 2012

Article type: Atomic Spectrometry Update
DOI: 10.1039/C2JA90045A
Citation: J. Anal. At. Spectrom., 2012,27, 1603-1644
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    Atomic spectrometry update—X-ray fluorescence spectrometry

    M. West, A. T. Ellis, P. J. Potts, C. Streli, C. Vanhoof, D. Wegrzynek and P. Wobrauschek, J. Anal. At. Spectrom., 2012, 27, 1603
    DOI: 10.1039/C2JA90045A

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