Issue 6, 2012

The evolution of Ge nanostructures growth on silicon substrate by reduction of GeO2

Abstract

Various shaped and sized Ge nanostructures were obtained by reducing GeO2 powder under a H2 atmosphere in a high-temperature tubular furnace. At a high depositing temperature region, crystalline Ge film was epitaxially grown on a silicon substrate. Jellyfish-like Ge/SiO2NWs composite structures were obtained next to germanium epitaxial film grown by Ge-catalyzed vapor–liquid–solid phase segregation mechanism. In addition, at the lower depositing temperature zones, Ge nanowires with various morphologies were formed owing to the temperature and concentration gradient by oxide-assisted vapor–solid mechanism and Ostwald ripening.

Graphical abstract: The evolution of Ge nanostructures growth on silicon substrate by reduction of GeO2

Supplementary files

Article information

Article type
Paper
Submitted
05 Nov 2011
Accepted
21 Nov 2011
First published
19 Jan 2012

CrystEngComm, 2012,14, 2190-2195

The evolution of Ge nanostructures growth on silicon substrate by reduction of GeO2

H. Wu, H. Chiu and C. Lee, CrystEngComm, 2012, 14, 2190 DOI: 10.1039/C2CE06485E

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