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Issue 10, 2012
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Fast measurement of binding kinetics with dual slope SPR microchips

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Abstract

We demonstrate a new dual slope SPR technique that is ten-fold faster than the conventional step-response method. The new scheme utilizes rapid slope-based measurements followed by rapid reset, and it separates association and dissociation half reaction measurements at two separate sites inside a dual-chamber PDMS microfluidic chip. For a model CAII-ABS test system, the association and dissociation slopes were measured in 30 seconds compared to 5 minutes for step-response. The values of ka and kd calculated from the slope method are 3.66 ± 0.19 × 103 M−1 s−1 and 4.83 ± 0.17 × 10−2 s−1, respectively, matching well with step-response values while facilitating ∼10 to 15 fold faster detection and quantification.

Graphical abstract: Fast measurement of binding kinetics with dual slope SPR microchips

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Publication details

The article was received on 10 Jan 2012, accepted on 07 Mar 2012 and first published on 11 Apr 2012


Article type: Paper
DOI: 10.1039/C2AN35045A
Citation: Analyst, 2012,137, 2381-2385
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    Fast measurement of binding kinetics with dual slope SPR microchips

    T. Ghosh and C. H. Mastrangelo, Analyst, 2012, 137, 2381
    DOI: 10.1039/C2AN35045A

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