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Review Article

No time to lose—high throughput screening to assess nanomaterial safety

R. Damoiseaux,*ac   S. George,bd   M. Li,d   S. Pokhrel,e   Z. Ji,d   B. France,d   T. Xia,d   E. Suarez,d   R. Rallo,df   L. Mädler,ce   Y. Cohen,d   E. M. V. Hoekd and   A. Nel*bcd  
*
Corresponding authors
a
Molecular Screening Shared Resources, UC CEIN, NanoSystems Institute, University of California, 6522 CNSI, 570 Westwood, Los Angeles, USA
E-mail: Rdamoiseaux@mednet.ucla.edu
b
Department of Medicine-Division of NanoMedicine, UC CEIN, NanoSystems Institute, University of California, 6522 CNSI, 570 Westwood Plaza, Los Angeles, USA
E-mail: ANel@mednet.ucla.edu
c
California NanoSystems Institute at University of California, Los Angeles, USA
d
Center for Environmental Implications of Nanotechnology, University of California, Los Angeles, USA
e
IWT Foundation Institute of Materials Science, Department of Production Engineering, University of Bremen, Germany
f
Departament d'Enginyeria Informatica i Matematiques, Universitat Rovira i Virgili, Catalunya, Spain
Nanoscale, 2011,3, 1345-1360

DOI: 10.1039/C0NR00618A
Received 21 Aug 2010, Accepted 11 Oct 2010
First published online 07 Feb 2011
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