Jump to main content
Jump to site search

Issue 15, 2011
Previous Article Next Article

Probing liquid surfaces under vacuum using SEM and ToF-SIMS

Author affiliations

Abstract

We report a newly developed self-contained interface for high-vapor pressure liquid surfaces to vacuum-based analytical instruments. It requires no wires or tubing connections to the outside of the instrument and uses a microfluidic channel with a 3 μm diameter window into the flowing fluid beneath it. This window supports the liquid against the vacuum by the liquid's surface tension and limits the high-density vapor region traversed by the probe beams to only a few microns. We demonstrate this microfluidic interface for in situ liquid surfaces in a time-of-flight secondary ion mass spectrometer (ToF-SIMS) and a scanning electron microscope (SEM) with chemical analysis.

Graphical abstract: Probing liquid surfaces under vacuum using SEM and ToF-SIMS

Back to tab navigation

Supplementary files

Publication details

The article was received on 07 Dec 2010, accepted on 18 May 2011 and first published on 14 Jun 2011


Article type: Communication
DOI: 10.1039/C0LC00676A
Citation: Lab Chip, 2011,11, 2481-2484
  •   Request permissions

    Probing liquid surfaces under vacuum using SEM and ToF-SIMS

    L. Yang, X. Yu, Z. Zhu, M. J. Iedema and J. P. Cowin, Lab Chip, 2011, 11, 2481
    DOI: 10.1039/C0LC00676A

Search articles by author

Spotlight

Advertisements