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Issue 15, 2011
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Probing liquid surfaces under vacuum using SEM and ToF-SIMS

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We report a newly developed self-contained interface for high-vapor pressure liquid surfaces to vacuum-based analytical instruments. It requires no wires or tubing connections to the outside of the instrument and uses a microfluidic channel with a 3 μm diameter window into the flowing fluid beneath it. This window supports the liquid against the vacuum by the liquid's surface tension and limits the high-density vapor region traversed by the probe beams to only a few microns. We demonstrate this microfluidic interface for in situ liquid surfaces in a time-of-flight secondary ion mass spectrometer (ToF-SIMS) and a scanning electron microscope (SEM) with chemical analysis.

Graphical abstract: Probing liquid surfaces under vacuum using SEM and ToF-SIMS

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Publication details

The article was received on 07 Dec 2010, accepted on 18 May 2011 and first published on 14 Jun 2011

Article type: Communication
DOI: 10.1039/C0LC00676A
Citation: Lab Chip, 2011,11, 2481-2484
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    Probing liquid surfaces under vacuum using SEM and ToF-SIMS

    L. Yang, X. Yu, Z. Zhu, M. J. Iedema and J. P. Cowin, Lab Chip, 2011, 11, 2481
    DOI: 10.1039/C0LC00676A

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