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Issue 38, 2011
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Nano-scale chemical imaging of a single sheet of reduced graphene oxide

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Abstract

Scanning transmission X-ray microscopy (STXM) has been used to chemically image single and multiple layers of a thermally reduced graphene oxide (r-GO) multi-layer sheet of the size of ∼1 μm and a thickness of ∼5 nm. The thickness of individual layers in the single sheet can be identified through quantitative analysis of STXM. The local electronic and chemical structure of interest (edge versus center) in different regions within the single r-GO sheet has been studied by C K-edge X-ray absorption near edge structure spectroscopy (XANES) with 30 nm spatial resolution. High and localized unoccupied densities of states (DOS) of carbon σ* character were observed in r-GO compared to graphite and were interpreted as the lack of strong layer to layer interaction in the former. The azimuthal dependence of C K-edge XANES in selected locations has also been obtained and was used to infer the preferred edge structure. The r-GO sample was also characterized by TEM, AFM and Raman spectroscopy; the findings are in good accord with the STXM results.

Graphical abstract: Nano-scale chemical imaging of a single sheet of reduced graphene oxide

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Publication details

The article was received on 11 Mar 2011, accepted on 14 Jun 2011 and first published on 15 Aug 2011


Article type: Paper
DOI: 10.1039/C1JM11071C
Citation: J. Mater. Chem., 2011,21, 14622-14630
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    Nano-scale chemical imaging of a single sheet of reduced graphene oxide

    J. G. Zhou, J. Wang, C. L. Sun, J. M. Maley, R. Sammynaiken, T. K. Sham and W. F. Pong, J. Mater. Chem., 2011, 21, 14622
    DOI: 10.1039/C1JM11071C

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