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Issue 10, 2011
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Pushing the limits for fast spatially resolved elemental distribution patterns

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Abstract

A new setup for fast spatially resolved measurements of elemental trace amounts under total reflection conditions using a new colour X-ray camera is described. Samples prepared on conventional total reflection X-ray fluorescence (TXRF) reflectors were measured at BESSY II synchrotron. A spatial resolution of 50 × 50 μm2 was obtained, while the required time for the investigation of a 10 × 10 mm2 sample is 30 seconds. The set-up is up to 350 times faster than conventional X-ray fluorescence systems for elemental traces. The major components of the X-ray camera are polycapillary optics and a pn-CCD chip with an active area of 13 × 13 mm2. This area is divided into 264 × 264 pixels of 48 × 48 μm2. A full X-ray spectrum with a resolution of 152 eV @ 5.9 keV and a chip temperature of 246 K is recorded for each pixel. The chip has a read-out rate of 400 Hz.

Graphical abstract: Pushing the limits for fast spatially resolved elemental distribution patterns

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Publication details

The article was received on 24 Feb 2011, accepted on 13 Jun 2011 and first published on 27 Jul 2011


Article type: Paper
DOI: 10.1039/C1JA10069F
Citation: J. Anal. At. Spectrom., 2011,26, 1986-1989
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    Pushing the limits for fast spatially resolved elemental distribution patterns

    A. Kühn, O. Scharf, I. Ordavo, H. Riesemeier, U. Reinholz, M. Radtke, A. Berger, M. Ostermann and U. Panne, J. Anal. At. Spectrom., 2011, 26, 1986
    DOI: 10.1039/C1JA10069F

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