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Silicon speciation by hyphenated techniques for environmental, biological and industrial issues: A review

Physics and Analysis Division, IFP Energies Nouvelles-Lyon, Solaize
LCABIE-IPREM, UMR 5254, CNRS-UPPA, Hélioparc, 2 av. Pr. Angot, Pau
J. Anal. At. Spectrom., 2011,26, 30-51

DOI: 10.1039/C0JA00152J
Received 09 Sep 2010, Accepted 17 Nov 2010
First published online 08 Dec 2010

This article is part of themed collection: Speciation
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Journal of Analytical Atomic Spectrometry - Information Point