Issue 30, 2011

Morphological phase separation in unstable thin films: pattern formation and growth

Abstract

We present results from a comprehensive numerical study of morphological phase separation (MPS) in unstable thin liquid films on a 2-dimensional substrate. We study the quantitative properties of the evolution morphology via several experimentally relevant markers, e.g., correlation function, structure factor, domain-size and defect-size probability distributions, and growth laws. Our results suggest that the late-stage morphologies exhibit dynamical scaling, and their evolution is self-similar in time. We emphasize the analogies and differences between MPS in films and segregation kinetics in unstable binary mixtures.

Graphical abstract: Morphological phase separation in unstable thin films: pattern formation and growth

Article information

Article type
Communication
Submitted
31 Dec 2010
Accepted
13 Jun 2011
First published
24 Jun 2011

Phys. Chem. Chem. Phys., 2011,13, 13598-13603

Morphological phase separation in unstable thin films: pattern formation and growth

P. K. Jaiswal, M. Vashishtha, S. Puri and R. Khanna, Phys. Chem. Chem. Phys., 2011, 13, 13598 DOI: 10.1039/C0CP03013A

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