Issue 3, 2011

A facile approach for quantifying the density of defects (edge plane sites) of carbon nanomaterials and related structures

Abstract

A facile methodology based on cyclic voltammetry is presented allowing the density of defects, viz edge plane like-sites/defects of carbon nanomaterials to be readily quantified. The approach is based on the construction of carbon nanomaterial paste electrodes which is measured using cyclic voltammetry and a standard electrochemical redox probe. This protocol allows a quantitative relationship between the heterogeneous electron-transfer rate and the density of defects to be readily determined and also provides researchers with a methodology to quantify the density of defects for comparative purposes.

Graphical abstract: A facile approach for quantifying the density of defects (edge plane sites) of carbon nanomaterials and related structures

Article information

Article type
Paper
Submitted
20 Aug 2010
Accepted
29 Oct 2010
First published
15 Nov 2010

Phys. Chem. Chem. Phys., 2011,13, 1210-1213

A facile approach for quantifying the density of defects (edge plane sites) of carbon nanomaterials and related structures

P. M. Hallam and C. E. Banks, Phys. Chem. Chem. Phys., 2011, 13, 1210 DOI: 10.1039/C0CP01562H

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