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Issue 3, 2011
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A facile approach for quantifying the density of defects (edge plane sites) of carbon nanomaterials and related structures

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Abstract

A facile methodology based on cyclic voltammetry is presented allowing the density of defects, viz edge plane like-sites/defects of carbon nanomaterials to be readily quantified. The approach is based on the construction of carbon nanomaterial paste electrodes which is measured using cyclic voltammetry and a standard electrochemical redox probe. This protocol allows a quantitative relationship between the heterogeneous electron-transfer rate and the density of defects to be readily determined and also provides researchers with a methodology to quantify the density of defects for comparative purposes.

Graphical abstract: A facile approach for quantifying the density of defects (edge plane sites) of carbon nanomaterials and related structures

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Publication details

The article was received on 20 Aug 2010, accepted on 29 Oct 2010 and first published on 15 Nov 2010


Article type: Paper
DOI: 10.1039/C0CP01562H
Citation: Phys. Chem. Chem. Phys., 2011,13, 1210-1213
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    A facile approach for quantifying the density of defects (edge plane sites) of carbon nanomaterials and related structures

    P. M. Hallam and C. E. Banks, Phys. Chem. Chem. Phys., 2011, 13, 1210
    DOI: 10.1039/C0CP01562H

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