Measuring Si–C60 chemical forces via single molecule spectroscopy

Cristina Chiutu; Andrew Stannard; Adam M. Sweetman; Philip Moriarty

doi:10.1039/C1CC14147C

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Chemical Communications

Issue 38, 2011

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Measuring Si–C₆₀ chemical forces via single molecule spectroscopy

Cristina Chiutu , Andrew Stannard , Adam M. Sweetman and Philip Moriarty

Chem. Commun., 2011, 47, 10575-10577

DOI: 10.1039/C1CC14147C
Received 11 Jul 2011, Accepted 09 Aug 2011
First published on the web 24 Aug 2011
This article is part of the collection: Molecule-based surface chemistry

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Abstract
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We measure the short-range chemical force between a silicon-terminated tip and individual adsorbed C₆₀ molecules using frequency modulation atomic force microscopy. The interaction with an adsorbed fullerene is sufficiently strong to drive significant atomic rearrangement of tip structures.

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Chemical Communications

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