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Issue 15, 2011
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Non-invasive analysis of turbid samples using deep Raman spectroscopy

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Abstract

Raman spectroscopy has recently seen major advances in the area of deep non-invasive characterisation of diffusely scattering samples; this progress is underpinned by the emergence of spatially offset Raman spectroscopy and associated renaissance of transmission Raman spectroscopy permitting the characterisation of diffusely scattering samples at depths not accessible by conventional Raman spectroscopy. Examples of emerging research activities include non-invasive diagnosis of bone disease and cancer, rapid quality control of pharmaceutical formulations and security screening of explosives and counterfeit drugs through unopened translucent bottles. This article reviews this field focusing on recent developments with high societal relevance.

Graphical abstract: Non-invasive analysis of turbid samples using deep Raman spectroscopy

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Publication details

The article was received on 15 Sep 2010, accepted on 28 Oct 2010 and first published on 02 Dec 2010


Article type: Minireview
DOI: 10.1039/C0AN00723D
Citation: Analyst, 2011,136, 3039-3050
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    Non-invasive analysis of turbid samples using deep Raman spectroscopy

    K. Buckley and P. Matousek, Analyst, 2011, 136, 3039
    DOI: 10.1039/C0AN00723D

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