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Paper

Dielectric interlayers for increasing the transparency of metal films for mid-infrared attenuated total reflection spectroscopy

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Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany
E-mail: a.erbe@mpie.de, aerbe@arcor.de, m.reithmeier@mpie.de;
Fax: +49 211 6792218 ;
Tel: +49 211 6792890
Phys. Chem. Chem. Phys., 2010,12, 14798-14803

DOI: 10.1039/C0CP01125H
Received 08 Jul 2010, Accepted 28 Sep 2010
First published online 13 Oct 2010
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