Electrical properties of sol–gel derived MPB 0.37BiScO3–0.63PbTiO3 thin films deposited on iridium oxide electrodes
Abstract
The characterization of sol–gel derived morphotropic phase boundary (MPB) 0.37BiScO3–0.63PbTiO3 (BSPT) thin films, deposited on IrO2/TiO2/SiO2/Si and Pt/TiO2/SiO2/Si substrates, was performed to identify the influence of the IrO2electrodes on the film's microstructure and electrical properties. Though the ferroelectric behaviour of both films is similar, with remanent polarization values of 26 µC cm−2 and 23 µC cm−2, respectively, for IrO2 and Pt bottom electroded films, the leakage current density (JL) at room temperature markedly decreases from > 10−6 A cm−2 for BSPT on Pt to the order of ≤ 10−8 A cm−2 for BSPT on IrO2, under the maximum voltage of 4 V (∼80 kV cm−1). The formation of an interface layer between the film and the electrode, as observed by